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Issue Eur. Phys. J. B
Volume 13, Number 4, February 2000
Page(s) 755 - 763
DOI 10.1007/s100510050095

Eur. Phys. J. B 13, 755-763

Experimental feasibility of phaseless inverse scattering methods for specular reflectivity

A. van der Lee

Laboratoire des Matériaux et Procédés Membranaires[*], 8 rue de l'École Normale, 34296 Montpellier Cedex 5, France
avderlee@crit1.univ-montp2.fr

Received 19 May 1999

Abstract
The possibilities for calculating the X-ray or neutron scattering potential across a thin film from experimental specular reflectivity amplitude information alone and using full dynamical theory, i.e., phaseless inverse scattering, are investigated and compared with traditional fitting methods. The feasibility of the method is demonstrated by one trivial and two non-trivial experimental examples. The usefulness, but also the limitations are outlined by the experiments and by numerical examples. The data reduction is treated in some detail and, in particular, a new method is proposed for deconvolving the experimental data from the instrumental smearing function.

PACS
61.10.Kw X-ray reflectometry (surfaces, interfaces, films) - 68.35.Ct Interface structure
and roughness - 68.55.Jk Structure and morphology; thickness

Copyright EDP Sciences, Società Italiana di Fisica, Springer-Verlag



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