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Eur. Phys. J. B 13, 755-763
Experimental feasibility of phaseless inverse scattering methods for specular reflectivity
A. van der Lee
Laboratoire des Matériaux et Procédés Membranaires
, 8 rue de l'École Normale, 34296 Montpellier Cedex 5, France
avderlee@crit1.univ-montp2.fr
Received 19 May 1999
Abstract
The possibilities for calculating the X-ray or neutron scattering potential across a
thin film from experimental specular reflectivity amplitude information alone and using
full dynamical theory, i.e., phaseless inverse scattering, are investigated
and compared with traditional fitting methods. The feasibility of the method is
demonstrated by one trivial and two non-trivial experimental examples. The usefulness,
but also the limitations are outlined by the experiments and by numerical examples. The
data reduction is treated in some detail and, in particular, a new method is proposed
for deconvolving the experimental data from the instrumental smearing function.
PACS
61.10.Kw X-ray reflectometry (surfaces, interfaces, films) -
68.35.Ct Interface structure
and roughness -
68.55.Jk Structure and morphology; thickness
Copyright EDP Sciences, Società Italiana di Fisica, Springer-Verlag
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